Effects of temperature in deep-submicron global interconnect optimization in future technology nodes
نویسندگان
چکیده
The resistance of on-chip interconnects and the current drive of transistors are strongly temperature dependent. As a result, the interconnect performance in DeepSubmicron technologies is affected by temperature in a substantial proportion. In this paper we evaluate thermal effects in global RLC interconnects and quantify their impact in a standard optimization procedure based on repeaters insertion. By evaluating the difference between a simple RC and an accurate RLC model, we show how the temperature induced increase of resistance may reduce the impact of inductance. We also project the evolution of such effects in future CMOS technologies, according to the semiconductor roadmap.
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The resistance of on-chip interconnects and the current drive of transistors is strongly temperature dependent. As a result, the interconnect performance is affected by the temperature in a sizeable proportion. In this paper we evaluate thermal effects in global RLC interconnects and quantify their impact in a standard optimization procedure in which repeaters are used. By evaluating the differ...
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ورودعنوان ژورنال:
- Microelectronics Journal
دوره 35 شماره
صفحات -
تاریخ انتشار 2004